【英文标准名称】:StandardGuideforSelectingDosimetrySystemsforApplicationinPulsedX-RaySources
【原文标准名称】:选择脉冲X射线源用的剂量测定系统的标准指南
【标准号】:ASTME1894-2008
【标准状态】:现行
【国别】:美国
【发布日期】:2008
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E10.07
【标准类型】:(Guide)
【标准水平】:()
【中文主题词】:
【英文主题词】:calorimeter;Comptondiodedosimetry;dosimetry;opticalwaveguidedosimetry;photoconductivedetector(PCD);PINdiodedosimetry;pulsedX-raysource;radiochromicdosimetrysystem;scintillator-photodetectordosimetry;thermoluminescencedosimetry;Ther
【摘要】:FlashX-rayfacilitiesprovideintensebremsstrahlungradiationenvironments,usuallyinasinglesub-microsecondpulse,whichunfortunately,oftenfluctuatesinamplitude,shape,andspectrumfromshottoshot.Therefore,appropriatedosimetrymustbefieldedoneveryexposuretocharacterizetheenvironment,seeICRUReport34.Theseintensebremsstrahlungsourceshaveavarietyofapplicationswhichincludethefollowing:GenerationofX-rayandgamma-rayenvironmentssimilartothatfromanuclearweaponburst.StudiesoftheeffectsofXraysandgammaraysonmaterials.Studiesoftheeffectsofradiationonelectronicdevicessuchastransistors,diodes,andcapacitors.Vulnerabilityandsurvivabilitytestingofmilitarysystemsandcomponents.Computercodevalidationstudies.Thisguideiswrittentoassisttheexperimenterinselectingtheneededdosimetrysystems(ofteninanexperimentnotallradiationparametersmustbemeasured)foruseatpulsedX-rayfacilities.Thisguidealsoprovidesabriefsummaryoftheinformationonhowtouseeachofthedosimetrysystems.Otherguides(seeSection3)providemoredetailedinformationonselecteddosimetrysystemsinradiationenvironmentsandshouldbeconsultedafteraninitialdecisionismadeontheappropriatedosimetrysystemtouse.TherearemanykeyparameterswhichdescribeaflashX-raysource,suchasdose,doserate,spectrum,pulsewidth,etc.,suchthattypicallynosingledosimetrysystemcanmeasurealltheparameterssimultaneously.FIG.1RangeofAvailableBremsstrahlungSpectrafromFlashX-raySources1.1ThisguideprovidesassistanceinselectingandusingdosimetrysystemsinflashX-rayexperiments.Bothdoseanddose-ratetechniquesaredescribed.1.2Operatingcharacteristicsofflashx-raysourcesaregiven,withemphasisonthespectrumofthephotonoutput.1.3Assistanceisprovidedtorelatethemeasureddosetotheresponseofadeviceundertest(DUT).Thedeviceisassumedtobeasemiconductorelectronicpartorsystem.
【中国标准分类号】:F80
【国际标准分类号】:17_240
【页数】:19P.;A4
【正文语种】:英语